Quercus X-ray Technologies, LLC

Quercus X-ray Technologies,LLC

Who are we?
Quercus X-ray Technologies, LLC, based in Oak Park, IL, is devoted to developing innovative instrumentation for x-ray research. Our staff combined has more than 50 years total synchrotron radiation x-ray experience. We can provide expert consulting services on all aspects of x-ray absorption spectroscopy.

Our first products,  Bent Crystal Laue Analyzers, are now available for on-line sales through our exclusive distributor FMB-Oxford at http://www.fmb-oxford.com/.


Quercus Bent Laue Analyzers
Our first product is an simple, compact, economical, easy to align device that allows the user to select x-rays of a specific energy or wavelength that are emitted from a sample and to reject x-rays of other energies. The primary application at present is x-ray fluorescence spectroscopy and XAFS at third generation synchrotron radiation sources. Applications to electron microscopy, EDAX, PIXE, and other areas are welcomed.

We first conceived these devices in 1995 to address the problem of count rate limitations of energy dispersive detectors for X-ray Spectroscopy. For optimum performance they require a beam spot that is <200 micron in one dimension and <2 mm in the other.

The photo on the left shows front and rear views of bent laue analyzers optimized for the Platinum L-alpha fluorescence, and Arsenic K-alpha fluorescence. The reflective surface that is visible is a thin asymmetic cut silicon crystal that is bent to the correct logarithmic spiral shape. The integral slit assemblies image the virtual source caustic of the x-rays. The materials of the pure metal slits (Sn and Mo) are chosen to minimize slit fluorescence. The mathematical shape of the bender, crystal thickness, cut, asymmetry angle, slit orientation, and materials used are selected to optimize performance for each design energy. During an experiment, alignment of the units can be easily done in 20 minutes or less using just two generic motorized translation stages. The back end detector can be a standard XAFS detector: fluorescence ion chamber, photomultiplier/PMT, proportional counter, PIN diode (large area), or multielement solid state detector.
Our bent crystal laue analyzers (BCLAs) are available off the shelf through FMB-Oxford (www.fmb-oxford.com).

We also can build custom solutions with different characteristics for your scientific research needs.
For technical information, please email:
bunker@quercustech.com

 

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